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authorTianjie Xu <xunchang@google.com>2019-12-10 10:56:01 -0800
committerTianjie Xu <xunchang@google.com>2019-12-10 20:16:39 -0800
commit173e619eaec17f9703b0e55d1cfdd039311f809a (patch)
tree0d8f6e9f9e289496f3b78314ad7e46ef3d4ad7d2 /common/error_code_utils.cc
parent6eec995ac79c66741e665fce9a30613844d59384 (diff)
Switch to use libdm to bind loop devices
This is a speculative fix of the flaky unit test. There used to be a race condition when the test tries to find a free loop device and binds to it. Switch to libdm in android to address the race. In the local test, the device gets into a state where kernel fails to open the loop device returned by LOOP_CTL_GET_FREE. This cl tries to prevent the device from entering the erroneous state. Though it's not clear if the test itself put the device into such state. It's still worth trying if there'is less flakiness after this cl. Bug: 145706147 Test: unit tests pass Change-Id: I3abbba2ef801d787c575696f5d0ce553c43545ca
Diffstat (limited to 'common/error_code_utils.cc')
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