Age | Commit message (Collapse) | Author |
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Bug: 219076736
Test: VtsAidlKeyMintTargetTest
Change-Id: Ia696d7765f316d35eba1b4e65acae6c1072987b1
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d347852bcc
Original change: https://android-review.googlesource.com/c/platform/hardware/interfaces/+/2051222
Bug: 230803681
Change-Id: I42b63bdea5fa0fb6c3a79e457f8bd63c6b346111
Signed-off-by: Automerger Merge Worker <android-build-automerger-merge-worker@system.gserviceaccount.com>
(cherry picked from commit 009d595c0f84d060120b9012d8fa6a9921664b14)
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Don't run tests if the appropriate KeyMint device is not available (e.g.
on something that only has Keymaster). Move to use GTEST_SKIP
consistently.
Bug: 221909227
Test: VtsAidlKeyMintTargetTest
Change-Id: I5dab238519e57e6752b795f3a983681cf4337bdd
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Bug: 221909227
Test: VtsAidlKeyMintTargetTest
Change-Id: Ic0722242cee2ea21c974133e4f81b13b21e44615
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On some devices it is infeasible to provision the KeyMint RoT bits in
the Android Bootloader. This provides an alternate path to provision
them from the TEE during early boot.
Bug: 219076736
Test: VtsAidlKeyMintTargetTest
Change-Id: If69f7e25e58edbf4d2190084e2c0a03a94bfa5d6
Merged-In: If69f7e25e58edbf4d2190084e2c0a03a94bfa5d6
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