Age | Commit message (Collapse) | Author |
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Bug: 225941299
Test: m
Change-Id: I61eb51c0334eb99489c6f1570110d7e18c350c99
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This CL adds a VTS test for the DICE HAL, and a test specific for
demotion testing. Demotion testing leaves the device in a permanently
modified state untill the next reboot, which is why it needs a special
test config. The current test config restarts the device before testing,
in a followup the device also has to reboot after the test.
Bug: 198197213
Test: atest VtsAidlDiceTargetTest
atest VtsAidlDiceDemoteTargetTest
Change-Id: I4278a1352df749da50dc8e5d118fc37336026061
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Test: ... one ...
Bug: 198197213
Change-Id: If855e2a4a0150d80e7cecce0a078cdeca00bdb50
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Bug: 218494522
Test: Builds
Change-Id: Ica240e1d268403ba546d83c86596d72bacec2bdf
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Bug: 214233409
Test: Builds
Change-Id: I1640b64fbb4b63097106dba56269fe1cac6d1679
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Bug: 210149444
Test: N/A
Change-Id: I1d4e502cb6535117f51d2d0ce008f2669fc90e96
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The dice HAL provides access to the Dice artifacts of the running Android
instance.
Bug: 198197213
Test: VTS test comming in two ...
Change-Id: I6e84f9a9c7153e7a96c06d1d451e658b3f222586
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