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| author | Yi Jin <jinyithu@google.com> | 2018-04-03 15:10:34 -0700 |
|---|---|---|
| committer | Yi Jin <jinyithu@google.com> | 2018-04-04 16:29:55 -0700 |
| commit | ad3e6e5d5a9746bfe9d4600172798c9d6309b149 (patch) | |
| tree | 44c6eb169ebdb86f7bc9e73d8b9f3d97d96f2d4e /docs/html/sdk/api_diff/16/changes | |
| parent | 3275d9a004a45f4a2a9e30bbe7c662955ebdb9ff (diff) | |
This cl tries to fix cts tests IncidentdTest
1. Disable BatteryType section which is device-specific
2. Make timeout longer since meminfo section timedout in test
3. make some negative values sint
4. varint can be 64 bits, there is a bug implicitly convert it to 32
which loses values.
5. Found another bug which failed to read 64 bits varint, create a
native test to make sure it works.
Bug: 77291057
Test: atest CtsIncidentHostTestCases:com.android.server.cts.IncidentdTest
Change-Id: I04cc730741f7901f37ac57a11af7777d57118a23
Diffstat (limited to 'docs/html/sdk/api_diff/16/changes')
0 files changed, 0 insertions, 0 deletions